gdat-c介电常数介质损耗试验仪/介电常数测试仪
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所在地
它符合国标GB/T 1409-2006,GB/T 1693-2007,美标ASTM D150以及IEC60250规范要求。
c类数显Q表工作频率范围是10kHz~60MHz,是一种多功能、多用途、多量程数字化阻抗测试仪器。它是根据串联谐振原理,以电压比值刻度Q值的。它能测量高频电感器的Q值,电感量和分布电容量;电容器的电容量和损耗角。配以夹具BH916介质损耗装置还能对固态绝缘材料的高频介质损耗(tanδ)和介电常数(ε),高频回路有效并联及串联电阻,传输线的特性阻抗等进行测试。本Q表依照国家计量检定规程:“JJF1073-2000高频Q表校准规范”执行。
1 特点:
◎ 本公司创新的自动Q值读取技术,使测Q分辨率至0.1Q。
◎ DPLL合成发生1kHz~70MHz,测试信号。
◎ 低至20nH残余电感,保证高频时直读Q值的误差较小。
◎ 特制LCD屏菜单式显示多参数:Q值,测试频率,调谐状态等。
◎ Q值量程自动/手动量程控制。
◎ 数字化Q值预置,能提高批量测试的可靠性和速度。
2 主要技术指标:
2.1 测试信号频率范围:1kHz~70MHz,数字合成,可数字设置或连续调节,五位有效数显。
2.2 Q值测量范围:1~1000四位数显,分辨率0.1Q。分100、316、999三档,量程可自动切换。
2.3 Q值固有误差:±5%±3% 满刻度值。
2.4 有效电感测量范围:0.1µH~1000mH。
2.5 电感测量误差:≤5%±0.02µH
2.6 调谐电容特性:
2.6.1可调电容范围:40pF~500 pF。
2.6.2 精确度:±1% 或0.5pF。
2.6.3微调电容器:-3pF~0~+3pF,分辨率:0.2pF
2.6.4残余电感值:约30nH。
2.7 Q预置功能:Q预置范围:1~1000均可。被测件达到预置值后有“GO”显示和蜂鸣声提示。不合格件则显示“NO GO”。
2.8 外形尺寸及重量:415×180×170(mm),6.5kg。
BH916 介质损耗测试装置(数显)
BH916D介质损耗测试装置与C类Q表及电感器配用,能对绝缘材料进行高频介质损耗角正切值(tanδ)和介电常数(ε)的测试。它符合国标GB/T 1409-2006,GB/T 1693-2007,美标ASTM D150以及IEC60250规范要求。
本测试装置是由测微平板电容器组成,平板电容器一般用来夹被测样品,配用Q表作为指示仪器。绝缘材料的损耗角正切值是通过被测样品放进平板电容器和不放进样品的Q值变化和厚度的刻度读数变化通过公式计算得到。同样,由平板电容器的刻度读数变化,通过公式计算得到介电常数。
1工作特性
1.1 平板电容器:
1.1.1 极片尺寸:
WY916D-38:Φ38mm.
WY916D-50:Φ50mm.
1.1.2 极片间距可调范围和分辨率:
≥8mm, ±0.002mm
1.2 夹具插头间距:
25mm±1mm
1.3夹具损耗角正切值
≤2.5×10-4
附表二,LKI-1电感组典型测试数据
线圈号 测试频率 Q值 分布电容p 电感值
9 100KHz 98 9.4 25mH
8 400KHz 138 11.4 4.87mH
7 400KHz 202 16 0.99mH
6 1MHz 196 13 252μH
5 2MHz 198 8.7 49.8μH
4 4.5MHz 231 7 10μH
3 12MHz 193 6.9 2.49μH
2 12MHz 229 6.4 0.508μH
1 25MHz 50MHz 233211 0.9 0.125μH
标签:介电常数介质损耗测试仪 介电常数测试仪 介质损耗测试仪 介质损耗介电常数测试仪
It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 and IEC60250 specifications.
Class C digital Q frequency range is 10kHz ~ 60MHz, is a multifunctional,multipurpose, multi range digital impedance test instrument. It is based on theprinciple of series resonance, the voltage ratio scales of Q value. It can measure theQ value of the high frequency inductor, inductance and distributed capacitance;capacitance and loss angle. With a dedicated fixture BH916 dielectric loss device also on high frequency dielectric loss of solid insulating materials (tan delta) and Permittivity (epsilon), high frequency circuit in parallel and series resistance, the characteristic impedance of the transmission line were investigated. The Q table in accordance with the national metrological verification regulations: "JJF1073-2000 high frequency Q calibration specification".
1 characteristics:
Read the technology of automatic Q of the company innovation value, the Qresolution to 0.1Q.
The synthesis of DPLL 1kHz ~ 70MHz, the test signal.
In the low to 20nH residual inductance, high frequency to ensure error is smaller by Q value.
Multi parameter of the special LCD screen menu display: Q value, the test frequency,the tuning status.
The Q value range automatic / manual range control.
The digital Q value preset, can improve the speed and reliability of the batch test.
2 main technical indexes:
The 2.1 test signal frequency range: 1kHz ~ 70MHz, digital synthesis, digital set oradjusted continuously, five effective digital display.
2.2 Q value range: 1 ~ 1000 four bit digital display, resolution 0.1Q. In 100, 316, 999third, range can be automatically switched.
2.3 Q values inherent error: ± 5% ± 3% of full scale value.
2.4 the effective inductance measurement range: 0.1 µ H ~ 1000mH.
The 2.5 inductance measurement error: = 5% ± 0.02 µ H
2.6 tuning capacitance characteristics:
2.6.1 adjustable capacitance range: 40pF ~ 500 pF.
2.6.2: accuracy of ± 1% or 0.5pF.
2.6.3 tuning capacitors are: -3pF ~ 0 ~ +3pF, resolution: 0.2pF
2.6.4 residual inductance: about 30nH.
2.7 Q preset function: Q preset range: 1 ~ 1000 may. The measured piece reaches a preset value "GO" display and beep prompt. The unqualified parts is displayed "NOGO".
2.8 dimensions and weight: 415 x 180 x 170 (mm), 6.5kg.
BH916 dielectric loss test device (Shu Xian)
Dielectric loss test device and the C BH916D Q table and the inductor with theinsulating materials, high frequency dielectric loss tangent (tan delta) and Permittivity(epsilon) test. It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 and IEC60250 specifications.
The testing device is composed of a micrometer capacitor plate, plate capacitor is usually used to clamp the sample, equipped with the Q table as indicating instrument.Insulating material loss angle tangent value is calculated by the formula of scale reading changes through the tested sample into the panel capacitor and do not put it in the samples of Q value change and the thickness of the obtained. Similarly, thescale reading changes of the panel capacitor, to obtain the dielectric constant is calculated by a formula.
The 1 job characteristics
1.1 the panel capacitor:
1.1.1 sheet size:
WY916D-38: a 38mm.
WY916D-50: a 50mm.
The 1.1.2 pole spacing adjustable range and resolution:
≥ 8mm, ± 0.002mm
The 1.2 fixture plug spacing:
25mm + 1mm
The 1.3 fixture loss angle tangent value
≤ 2.5 × 10-4
Table two, LKI-1 inductance group typical test data
Coil test frequency distributions of Q values of P inductance capacitance
9 100KHz 989.4 25mH
8 400KHz 13811.4 4.87mH
7 400KHz 20216 0.99mH
6 1MHz H
5 2MHz 1988.7 49.8 μ
4 4.5MHz 231710 H
3 12MHz 1936.9 2.49 μ
2 12MHz 2296.4 0.508 μ
1 25MHz 50MHz 2332110.9 0.125 μ
Tags: dielectric loss tester dielectric constant test dielectric loss tester dielectric lossdielectric constant test