品牌
工程商厂商性质
广州市所在地
服务背景
IC作为重要的车载元器件部件，是AEC委员会持续关注的重点领域。AEC-Q100对IC的可靠性测试可细分为加速环境应力可靠性、加速寿命模拟可靠性、封装可靠性、晶圆制程可靠性、电学参数验证、缺陷筛查、包装完整性试验，且需要根据器件所能承受的温度等级选择测试条件。需要注意的是，第三方难以独立完成AEC-Q100的验证，需要晶圆供应商、封测厂配合完成，这更加考验对认证试验的整体把控能力。广电计量将根据客户的要求，依据标准对客户的IC进行评估，出具合理的认证方案，从而助力IC的可靠性认证。
测试周期
测试项目
| 序号 | 测试项目 | 缩写 | 样品数/批 | 批数 | 测试方法 |
| A组 加速环境应力试验 | |||||
| A1 | Preconditioning | PC | 77 | 3 | J-STD-020、 |
| JESD22-A113 | |||||
| A2 | Temperature-Humidity-Bias | THB | 77 | 3 | JESD22-A101 |
| Biased HAST | HAST | JESD22-A110 | |||
| A3 | Autoclave | AC | 77 | 3 | JESD22-A102 |
| Unbiased HAST | UHST | JESD22-A118 | |||
| Temperature-Humidity (without Bias) | TH | JESD22-A101 | |||
| A4 | Temperature Cycling | TC | 77 | 3 | JESD22-A104、Appendix 3 |
| A5 | Power Temperature Cycling | PTC | 45 | 1 | JESD22-A105 |
| A6 | High Temperature Storage Life | HSTL | 45 | 1 | JESD22-A103 |
| B组 加速寿命模拟试验 | |||||
| B1 | High Temperature Operating Life | HTOL | 77 | 3 | JESD22-A108 |
| B2 | Early Life Failure Rate | ELFR | 800 | 3 | AEC-Q100-008 |
| B3 | NVM Endurance, Data Retention, and Operational Life | EDR | 77 | 3 | AEC-Q100-005 |
| C组 封装完整性测试 | |||||
| C1 | Wire Bond Shear | WBS | 最少5个器件中的30根键合线 | AEC-Q100-001、AEC-Q003 | |
| C2 | Wire Bond Pull | WBP | MIL-STD883 method 2011、 | ||
| AEC-Q003 | |||||
| C3 | Solderability | SD | 15 | 1 | JESD22-B102或 J-STD-002D |
| C4 | Physical Dimensions | PD | 10 | 3 | JESD22-B100、 JESD22-B108 |
| AEC-Q003 | |||||
| C5 | Solder Ball Shear | SBS | 至少10个器件的5个键合球 | 3 | AEC-Q100-010、 |
| AEC-Q003 | |||||
| C6 | Lead Integrity | LI | 至少5个器件的10根引线 | 1 | JESD22-B105 |
| D组 晶圆制造可靠性测试 | |||||
| D1 | Electromigration | EM | / | / | / |
| D2 | Time Dependent Dielectric Breakdown | TDDB | / | / | / |
| D3 | Hot Carrier Injection | HCI | / | / | / |
| D4 | Negative Bias Temperature Instability | NBTI | / | / | / |
| D5 | Stress Migration | SM | / | / | / |
| E组 电学验证测试 | |||||
| E1 | Pre- and Post-Stress Function/Parameter | TEST | 所有要求做电学测试的应力试验的全部样品 | 供应商或用户规格 | |
| E2 | Electrostatic Discharge Human Body Model | HBM | 参考测试规范 | 1 | AEC-Q100-002 |
| E3 | Electrostatic Discharge Charged Device Model | CDM | 参考测试规范 | 1 | AEC-Q100-011 |
| E4 | Latch-Up | LU | 6 | 1 | AEC-Q100-004 |
| E5 | Electrical Distributions | ED | 30 | 3 | AEC Q100-009 |
| AEC Q003 | |||||
| E6 | Fault Grading | FG | - | - | AEC-Q100-007 |
| E7 | Characterization | CHAR | - | - | AEC-Q003 |
| E9 | Electromagnetic Compatibility | EMC | 1 | 1 | SAE J1752/3-辐射 |
| E10 | Short Circuit Characterization | SC | 10 | 3 | AEC-Q100-012 |
| E11 | Soft Error Rate | SER | 3 | 1 | JEDEC |
| 无加速：JESD89-1 | |||||
| 加速：JESD89-2或JESD89-3 | |||||
| E12 | Lead (Pb) Free | LF | 参考测试规范 | 参考测试规范 | AEC-Q005 |
| F组 缺陷筛选测试 | |||||
| F1 | Process Average Testing | PAT | / | / | AEC-Q001 |
| F2 | Statistical Bin/Yield Analysis | SBA | / | / | AEC-Q002 |
| G组 密封封装完整性测试 | |||||
| G1 | Mechanical Shock | MS | 15 | 1 | JESD22-B104 |
| G2 | Variable Frequency Vibration | VFV | 15 | 1 | JESD22-B103 |
| G3 | Constant Acceleration | CA | 15 | 1 | MIL-STD883 Method 2001 |
| G4 | Gross/Fine Leak | GFL | 15 | 1 | MIL-STD883 Method 1014 |
| G5 | Package Drop | DROP | 5 | 1 | / |
| G6 | Lid Torque | LT | 5 | 1 | MIL-STD883 Method 2024 |
| G7 | Die Shear | DS | 5 | 1 | MIL-STD883 Method 2019 |
| G8 | Internal Water Vapor | IWV | 5 | 1 | MIL-STD883 Method 1018 |
