有源探头| TAP2500 •Verification, Debug, and Characterization of High-speed Designs •Signal Integrity, Jitter, and Timing Analysis •Manufacturing Engineering and Test •Signals with Voltage Swings up
详细介绍
有源探头| TAP2500
产品说明:有源探头| TAP2500
Features & Benefits
Outstanding Electrical Performance
High Probe Bandwidth
Fast Probe Rise Time
Excellent Signal Fidelity
≤0.8 pF Input Capacitance
40 k? Input Resistance
–4 V to +4 V Input Dynamic Range
–10 V to +10 VDC Input Offset Range
±30 V (DC + peak AC) Max Input Voltage (Nondestruct)
Versatile Mechanical Performance
Small Compact Probe Head for Probing Small Geometry Circuit Elements
DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
Robust Design for Reliability
Easy-to-Use
Connects Directly to Oscilloscopes with the TekVPI™ Probe Interface
Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
Remote GPIB/USB Probe Control through the Oscilloscope
Applications
Verification, Debug, and Characterization of High-speed Designs