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进口品牌 纳米压痕仪可轻松准确测量硬涂层 薄膜和少量材料
面议光学轮廓仪 白光干涉仪 非接触式3D表面形貌测量系统
面议光学轮廓仪/3D显微镜 Zeta-300 支持3D量测和成像的功能
面议P-7 台阶仪/探针式轮廓仪 支持从几纳米到一毫米的台阶高度测量
面议光学轮廓仪Profilm3D 满足需要不同倍率物镜切换使用的测量应用
面议光学轮廓仪Zeta-20 是一款紧凑牢固的全集成光学轮廓显微镜
面议光学轮廓仪Profilm3D-200 标配200mm自动化X/Y平台
面议台阶仪 / 探针式轮廓仪 扫描可达200mm而无需图像拼接
面议NanoFlip纳米压痕仪 提供高精度XYZ位移,可定位样品进行测试
面议iNano®纳米压痕仪 可轻松测量薄膜、涂层和少量材料
面议光谱椭偏仪SE-1000 开放光学模型拟合分析过程 方便优化测试菜单
面议纳米级机械测试仪器 专为各种材料的表征和开发过程中进行测量
面议白光共聚焦轮廓仪MICROMESURE 2
产品主要特点:
Non contact dimensional measurement
Nanometric and Micrometric resolutions
White light sensor (no speckle, wide measuring range)
Coaxial measurement (no shadowing)
High local slopes on specular (reflective) surfaces
Insensitive to ambient light
Insensitive to object’s reflectivity: allows working on any type of surface
Thickness & Form Measurement of transparent objects
Wide measuring ranges capabilities (from 20 μm to 24 mm)
MICROMESURE is a modular measurement system dedicated to high resolution 3D microtopography and to shape and texture analysis. It can be used to measure profiles or surfaces of samples, as well as for measuring the thickness of transparent materials.
Due to high quality scanning system
Due to high quality scanning system
- Real metrology on each measured points thanks to linear encoders
- Flatness and orthogonality corrections
- Equipped with double turret
- User friendly Software
- Modular design (1, 2 or 3 axes) to adapt the configuration to the exact needs of the user
Delivered with all the necessary control & acquisition hardware and software, the MICROMESURE 2 system is a «turn key» device that is immediately operational after its installation.
- Point scanning system allows to define scans dimensions and resolution without hardware constraints
MICROMESURE 2 Systems